Our Latest Microscope Combines the Strengths of Four Essential Imaging and Measurement Technologies.
There are an increasing number of cases in which the KEYENCE Digital Microscope is adopted in order to not just resolve the issues of a single microscope, but to overcome the "limitations" of 4 major microscopes all at once. We will introduce you to examples in which the "limitations" of each of the four major microscopes are overcome.
Discover How to Achieve a Reduction in Product Damage and Reduce Downtime with Keyence's Unique Static Elimination Methods.
Dual I.C.C. System: This system enables optimal static elimination relative to the state of the electrode probe and changes in the amount of charge that is caused by heat and humidity in the ambient environment. "Pulse AC Method": This is a method that applies alternating high voltage (positive and negative) to the electrode probe, producing ions of both polarities. Compared to the conventional AC method, the amount of ions generated is higher and there is no uneven static elimination.
Learn the Technology Behind the Leading Precision Measurement Sensors and How They Can Work for You.
This quick guide illustrates technologies available for your high precision measurement needs. Learn the industry-best methods for measuring anything from thickness and step heights to eccentricity, warp, vibration, and many more.
Learn how to tackle new quality inspection requirements or even improve old ones. Our KEYENCE support system makes it easy to find and put together a solution that is custom-fit to your needs.
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