Improve production yield and detect defective products
KEY Technique Guide
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Measurement of width / pitch of leads
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The measurement area can be specified as needed.
(Outer diameter, Gap/Pitch measurement, etc.).
Two or more points can be measured simultaneously.
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KEY Technique
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KEY Technique
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Excellent repeatability of ±0.06µm or better.
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High accuracy (2 times greater than conventional models) is achieved by employing a new optical system and D.E. processor. In addition, high reliability and high-accuracy measurement is obtained without deviation of the optical axis caused by moving components.
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KEY Technique Guide
KEY Technique Guide
Improve production yield and detect defective products
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Technical Guide(371KB 8pages)
KEY Technique Guide

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