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          Newsletter 2016

          May 16, 2016

          Subject :

          Technical Guides to Measurement & Inspection

          e-News@KEYENCE
          Saving Time on Automotive Part Measurement
          Learn techniques to save time on your component inspection with the latest KEYENCE measurement technology, the IM Series. This document uses six examples of automotive-related components to show how to perform a variety of checks, from dimension measurements to tolerance judgments.
          Troubleshooting Problems with Outer Diameter Measurement
          Many conventional instruments can have problems taking outer diameter measurements at high speeds, or on tilted targets. This free catalogue introduces KEYENCE technology designed to eliminate these problems and capture stable measurements on your outer diameter inspections.
          Time-Saving Microscope Techniques
          This is guide is a must read for anybody using multiple microscopes for different R&D applications. Learn how digital microscopes can combine the advantages of many different technologies, enabling observation, measurement and image capture in a single unit.
          Preventing the Release of Defects with Image Sensors
          Learn new tips for success with these Kaizen principles for quality and inspection. This technical guide provides you with real-life examples of image sensors being used for product defect inspection applications.
          2D Code Reading Made Easy
          Errors when reading 2D codes can lead to decreased rates of operation and defective products being released. Use this document to learn the tricks behind stable code reading.
          Reliable and Easy to-use Laser Sensor Technology
          Using the LV-Neo Series enables long distance detection for difficult applications while maintaining a focused, visible, and stable beam spot. Calibration couldn't be easier: 1-Touch Teach and Go.

          Technical E-news

          Learn the latest in sensors, vision systems, measuring instruments, laser markers and microscopes.