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          Newsletter 2017

          January 30, 2017

          Subject :

          New Machine Vision | Non-Contact Measurement | Auto ID

          [New Product] A Vision System Designed with Lighting in Mind
          The new CV-X400 Machine Vision System from KEYENCE makes it easy for anyone to create optimal images in three simple steps. The CV-X400 eliminates the need to select or define complex lighting settings, enabling even non-vision users to perform advanced inspections with ease.
          Read Multiple Barcodes Simultaneously
          Save time and increase the efficiency of your code reading. The SR-1000 Series Code Reader from KEYENCE has a wide field of view that is four times larger than conventional products. This makes it possible to read multiple barcodes on parts and manufacturing instructions as a batch with simple settings.
          The Causes of Static Cling
          Based on the size and electrical charge of your target, what range do you need to eliminate static electricity? Understand the mechanisms behind static cling of foreign particles and debris with these quick guides. Click to find out more.
          Five Reasons to Switch to Non-contact Measurement Systems
          Why are many people switching to non-contact measurement systems? Read our guide for an explanation of the advantages of non-contact measurement systems and benefits for productivity.
          19 Ways to Reduce Dimensional Measurement Time
          Have you ever wanted to measure the dimensions of complex appearances quickly and easily? This guide is a must-see for anyone who still hasn't checked out KEYENCE's IM image dimension measurement systems.
          Are Laser Markers Capable of More than Just Marking?
          Need to remove excess material accurately and with minimal damage? Have you considered laser marking? This illustrated guide shows how laser markers can be used to remove cable sheathing, deflash ICs and more.
          Microscopy Analysis Techniques
          Eliminate differing opinions on the cause of a product's defect with digital microscopy. Download our free guide to learn more about digital microscopes and techniques for convincing image capture and analysis.

          Technical E-news

          Learn the latest in sensors, vision systems, measuring instruments, laser markers and microscopes.

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