The latest Illumination Technology for KEYENCE's Image Dimension Measurement (IM) System unlocks new measurement options. Read about our newly added low-angle, dark-field illumination feature, and check out real-life examples.
It is difficult to prevent the release of defective products with sample inspections. This guide introduces examples of automated inspections using displacement sensors along with the associated cost benefits.
This guide introduces the advantages of digital microscopes that are not possible with conventional microscopes. It presents detailed points for consideration that clearly express how different digital microscopes are from conventional microscopes. Anyone can perform observations at the same level as an experienced user quickly and easily.
Absolutely no specialised knowledge is required. Just perform the operations indicated by navigation prompts to automatically execute OK/NG classification and misalignment correction. This leads to major improvements in the time and effort required to adjust vision systems.