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          Newsletter 2019

          March 25, 2019

          Subject :

          Secrets To Solve Your Applications with Ease

          e-News@KEYENCE
          Transform Dimensional Inspections with a Push of a Button!
          Reducing inspection time is directly linked to improvements in manufacturing efficiency. With the IM Series Instant Measurement System, it is possible to record measurements with a push of a button, in seconds, helping to remove bottlenecks in the production process.
          10 New Microscopy Techniques for Innovation
          Browse through our guide to learn about the latest microscope technology that can help you to get ahead of the game whether it is for research or quality inspections. You will learn about the benefits of handheld mode, on-screen measurements and fully focused images with an outstanding depth-of-field.
          Learn about Laser Technology: Introductory Guide
          What are lasers? What are the differences between oscillation methods? Read our guide to find out more about laser technology, the characteristics of different wavelengths and learn how they can help to solve your applications.
          3 Minute Masterclass: Contact vs Non-Contact Displacement Sensors
          Understand the differences between different contact and non-contact measurement devices using this handy technical guide. Weigh up the pros and cons of each technology across stability and cost to identify the best technology for your next measurement application.
          Know-How Guide for Static Elimination
          Learn some concrete countermeasures against static electricity with these example applications from the electronics and precision equipment industries. Use these techniques to help decrease defect rates and improve manufacturing yield.
          Handy 2D Code Verification Guidebook
          Learn about typical 2D code verification standards including ISO/IEC 15415 and ISO/IEC TR 29158 from this comprehensive guide.

          Technical E-news

          Learn the latest in sensors, vision systems, measuring instruments, laser markers and microscopes.